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College of Engineering(공과대학)School of Mechanical and Aerospace Engineering(기계항공공학부)Dept. of Mechanical Engineering(기계공학과)ME-Conference Papers(학술회의논문)

Dispersive White-light Interferometry for 3-D Inspection of Thin-Film Layers of Flat Panel Displays

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Ghi, YS / Park, J / Kim, Seung-Wooresearcher
Issue Date
2006-05
Language
ENG
Citation

Proceedings of the 6th euspen International Conference, pp.0 - 0

URI
http://hdl.handle.net/10203/144535
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ME-Conference Papers(학술회의논문)
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