Ta2O5-SiO2 Nano- Laminated Thin Films Grown by Plasma-Enhanced Atomic Layer Deposition
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | KANG SANG WON | - |
| dc.date.accessioned | 2013-03-17T09:10:35Z | - |
| dc.date.available | 2013-03-17T09:10:35Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2004-08-01 | - |
| dc.identifier.citation | Atomic layer deposition (ALD) 2004, v., no., pp.0 - 0 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/141909 | - |
| dc.language | ENG | - |
| dc.title | Ta2O5-SiO2 Nano- Laminated Thin Films Grown by Plasma-Enhanced Atomic Layer Deposition | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 0 | - |
| dc.citation.endingpage | 0 | - |
| dc.citation.publicationname | Atomic layer deposition (ALD) 2004 | - |
| dc.identifier.conferencecountry | Finland | - |
| dc.identifier.conferencecountry | Finland | - |
| dc.contributor.localauthor | KANG SANG WON | - |
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