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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Conference Papers(학술회의논문)

Observation of Ge2Sb2Te5 thin film phase transition behavior according to the number of cycles using transmission electron microscope and scanning probe microscope

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dc.contributor.authorKim, H-
dc.contributor.authorChoi, Si-Kyung-
dc.contributor.authorKang,S-
dc.contributor.authorOh, K.-
dc.contributor.authorKweon, S-
dc.date.accessioned2013-03-17T02:36:55Z-
dc.date.available2013-03-17T02:36:55Z-
dc.date.created2012-02-06-
dc.date.issued2006-11-27-
dc.identifier.citation2006 MRS Fall Meeting, v., no., pp.206 - 212-
dc.identifier.urihttp://hdl.handle.net/10203/138958-
dc.languageENG-
dc.titleObservation of Ge2Sb2Te5 thin film phase transition behavior according to the number of cycles using transmission electron microscope and scanning probe microscope-
dc.typeConference-
dc.identifier.scopusid2-s2.0-40949153487-
dc.type.rimsCONF-
dc.citation.beginningpage206-
dc.citation.endingpage212-
dc.citation.publicationname2006 MRS Fall Meeting-
dc.identifier.conferencecountryUnited States-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorChoi, Si-Kyung-
dc.contributor.nonIdAuthorKim, H-
dc.contributor.nonIdAuthorKang,S-
dc.contributor.nonIdAuthorOh, K.-
dc.contributor.nonIdAuthorKweon, S-
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MS-Conference Papers(학술회의논문)
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