DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, J-H | ko |
dc.contributor.author | Oh, H-Y | ko |
dc.contributor.author | Gweon, Dae-Gab | ko |
dc.date.accessioned | 2013-03-16T23:43:46Z | - |
dc.date.available | 2013-03-16T23:43:46Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1999-06 | - |
dc.identifier.citation | SPIE Conf. on Optical Engineering for Sensing and Nanotechnology, pp.303 - 306 | - |
dc.identifier.uri | http://hdl.handle.net/10203/137399 | - |
dc.language | English | - |
dc.publisher | SPIE | - |
dc.title | Analysis of shear force characteristic and piezoelectric tip-sample distance control for NSOM | - |
dc.type | Conference | - |
dc.identifier.wosid | 000083313900065 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 303 | - |
dc.citation.endingpage | 306 | - |
dc.citation.publicationname | SPIE Conf. on Optical Engineering for Sensing and Nanotechnology | - |
dc.identifier.conferencecountry | JA | - |
dc.identifier.conferencelocation | Yokohama | - |
dc.contributor.localauthor | Gweon, Dae-Gab | - |
dc.contributor.nonIdAuthor | Lee, J-H | - |
dc.contributor.nonIdAuthor | Oh, H-Y | - |
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