Composition, oxidation, and optical properties of fluorinated silicon nitride film by inductively coupled plasma enhanced chemical vapor deposition

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dc.contributor.authorJun, BHko
dc.contributor.authorLee, JSko
dc.contributor.authorKim, DWko
dc.contributor.authorSung, THko
dc.contributor.authorBae, Byeong-Sooko
dc.contributor.authorNo, Kwangsooko
dc.date.accessioned2007-09-05T01:23:15Z-
dc.date.available2007-09-05T01:23:15Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1999-03-
dc.identifier.citationJOURNAL OF MATERIALS RESEARCH, v.14, no.3, pp.995 - 1001-
dc.identifier.issn0884-2914-
dc.identifier.urihttp://hdl.handle.net/10203/1313-
dc.description.abstractAmorphous fluorinated silicon nitride films have been deposited with the variation of NF3 flow rate using SiH4, N-2, Ar, and NF3 gases by inductively coupled plasma enhanced chemical vapor deposition for the first time, and the absolute composition, oxidation mechanism, and optical properties were investigated. The absolute composition including hydrogen was performed by means of elastic recoil detection time of flight, It was found that the oxygen and fluorine contents in the film dramatically increased, but the hydrogen content decreased to below 4 at.% as the NF3 flow rate increased. The oxidation mechanism could be explained in terms of the incorporation of the activated residual oxygen species in the chamber into the film with unstable open structure by the fluorine-added plasma. It was shown that the density and optical properties such as refractive index, absorption coefficient, and optical energy gap depended on the film composition. The variations of the above properties for fluorinated silicon nitride film could be interpreted by the contents of fluorine and oxygen with high electronegativity.-
dc.description.sponsorshipThe authors thank Dr. J. K. Kim in Korea Institute of Geology, Mining and Materials for valuable assistance in the ERD-TOF measurement. This study was supported by the academic research fund of Ministry of Education, Republic of Korea, through Inter-University Semiconductor Research Center (ISRC 97-E-1024) in Seoul National University.en
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherMATERIALS RESEARCH SOCIETY-
dc.subjectMIXTURES-
dc.titleComposition, oxidation, and optical properties of fluorinated silicon nitride film by inductively coupled plasma enhanced chemical vapor deposition-
dc.typeArticle-
dc.identifier.wosid000082550300048-
dc.identifier.scopusid2-s2.0-0033096807-
dc.type.rimsART-
dc.citation.volume14-
dc.citation.issue3-
dc.citation.beginningpage995-
dc.citation.endingpage1001-
dc.citation.publicationnameJOURNAL OF MATERIALS RESEARCH-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorBae, Byeong-Soo-
dc.contributor.localauthorNo, Kwangsoo-
dc.contributor.nonIdAuthorJun, BH-
dc.contributor.nonIdAuthorLee, JS-
dc.contributor.nonIdAuthorKim, DW-
dc.contributor.nonIdAuthorSung, TH-
dc.type.journalArticleArticle-
dc.subject.keywordPlusMIXTURES-
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