Showing results 14341 to 14360 of 36208
Measurement of mechanical properties and residual stresses of bridged gold films and circular gold membranes Choi, W.S.; Choi, S.T.; Son, S.U.; Lee, S.S.; Yang, S.Y.; Earmme, Y.Y., Key Engineering Materials, Vol. 326-328, no.1, pp. 227-232, 2006 |
Measurement of Mechanical Properties of Advanced Thin Films using Water Surface Kim, JH; Jang, KR; 김택수, 2014 KSPE Fall Meeting, KSPE, 2014-10-29 |
Measurement of Mechanical Properties of Advanced Ultra-Thin Films using Water surface Platform Kim, JH; Jang, KR; Kim, Taek-Soo, International Conference on Experimental Mechanics 2014, International Conference on Experimental Mechanics, 2014-11-15 |
Measurement of mechanical properties of electroplated nickel thin film Baek, D.-C.; Park, T.-S.; Lee, Soon-Bok, ADVANCES IN FRACTURE AND FAILURE PREVENTION, PTS 1 AND 2, v.261-263, pp.417 - 422, 2004 |
Measurement of Mechanical Properties of Electroplated Nickel Thin Film for MEMS Application Back, DC; Park, TS; Lee, Soon-Bok; Lee, NK; Choi, TH; Na, KH, KSME 2003 Spring Conference, 2003 |
Measurement of mechanical properties of St 37 material at high strain rates using a split hopkinson pressure bar Afdhal; Gunawan, Leonardo; Santosa, Sigit P; Putra, Ichsan S; Huh, Hoon, 5th International Conference on Mechanical and Manufacturing Engineering 2014, ICME 2014, pp.562 - 566, Trans Tech Publications Ltd, 2014-10 |
Measurement of Nonlinear Time-variant Source Characteristics of Intake and Exhaust Systems in Fluid Machines 장승호; 이정권, 한국음향학회지, v.24, no.3, pp.87 - 89, 2005-09 |
Measurement of optical coefficients of tissue-like solutions using a combination method of infinite and semi-infinite geometries with continuous near infrared light Ko, W; Kwak, Yoon Keun; Kim, Soohyun, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.45, no.9A , pp.7158 - 7162, 2006-09 |
Measurement of partially specular objects by controlling imaging range Jeong J.; Hong D.; Cho, Hyungsuck, Optomechatronic Computer-Vision Systems II, 2007-10-08 |
Measurement of parts deformation and misalignment by using a visual sensing system Kim J.Y.; Cho, Hyungsuck; Kim S., Proceedings of the 1997 IEEE International Symposium on Computational Intelligence in Robotics and Automation, CIRA, pp.362 - 367, IEEE, 1997-07-10 |
Measurement of phase distributions on the surface in subcooled pool boiling of FC-72 Jung, J.; Kim, J.; Lee, Hyosang; Kim, Sung-Jin, INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER, v.115, pp.62 - 72, 2017-12 |
Measurement of point-spread function (PSF) for confocal fluorescence microscopy Song I.; Yoo H.; Choo J.; Gweon, Dae-Gab, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II, v.5878, pp.1 - 9, 2005-08-02 |
Measurement of Polarization Dependent Loss of Fiber Optic Components Using a Polarization Scrambler Kim, Jungwon; Kim, T. H.; Lee, B. W., 제 10회 광자기술 학술회의, 2001-11-02 |
MEASUREMENT OF PSF IN CONFOCAL SELF-INTERFERENCE MICROSCOPY Kang, DK; Yoo, HK; Gweon, Dae-Gab, Focus on Microscopy 2006, 2006-04-09 |
Measurement of R-values at Intermediate Strain Rates using a Digital Speckle Extensometry J. Huh; Y.J. Kim; Huh, Hoon, SEM 2011, SEM 2011, 2011-06-12 |
Measurement of residual stresses in thick composite cylinders by the radial-cut-cylinder-bending method Kim, JW; Lee, Dai Gil, COMPOSITE STRUCTURES, v.77, no.4, pp.444 - 456, 2007-02 |
Measurement of Source Parameters of an Automotive Intake System at Constant RPM Ih, Jeong-Guon, Inter noise, pp.0 - 0, 2004-08-01 |
Measurement of sub-fm/Hz(1/2) displacement spectral densities in ultrahigh-Q single-crystal microcavities with hertz-level lasers Jang, Yoon-Soo; Lim, Jinkang; Wang, Wenting; Kim, Seung-Woo; Savchenkov, Anatoliy; Matsko, Andrey B.; Wong, Chee Wei, PHOTONICS RESEARCH, v.10, no.5, pp.1202 - 1209, 2022-05 |
Measurement of sub-micrometer features based on the topographic contrast using reflection confocal microscopy Gweon, Dae-Gab; Lee, SW; Kang, DK; Yoo, HK; Kim, TJ; Lee, SW; Kim, KS, 2nd International Symposium on Nano-manufacturing, Optical Society of Korea, 2004-11-03 |
Measurement of Sub-micrometer Features Based on The Topographic Contrast Using Reflection Confocal Microscopy Lee, SeungWoo; Kang, DongKyun; Yoo, Hongki; Kim, TaeJoong; Gweon, Dae-Gab; Lee, Suk-Won; Kim, Kwang-Soo, Current Optics and Photonics, v.9, no.1, pp.26 - 31, 2005-03 |
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