Browse "Dept. of Mechanical Engineering(기계공학과)" by Subject PROFILOMETRY

Showing results 10 to 13 of 13

10
Thickness-profile measurement of transparent thin-film layers by white-light scanning interferometry

Kim, Seung-Wooresearcher; Kim, GH, APPLIED OPTICS, v.38, no.28, pp.5968 - 5973, 1999-10

11
Thin-film thickness profile and its refractive index measurements by dispersive white-light interferometry

Ghim, Young-Sik; Kim, Seung-Wooresearcher, OPTICS EXPRESS, v.14, no.24, pp.11885 - 11891, 2006-11

12
Time-of-flight detection of femtosecond laser pulses for precise measurement of large microelectronic step height

Lu, Xing; Zhang, Shuangyou; Jeon, Chan-Gi; Kang, Chu-Shik; Kim, Jungwonresearcher; Shi, Kebin, OPTICS LETTERS, v.43, no.7, pp.1447 - 1450, 2018-04

13
White light on-axis digital holographic microscopy based on spectral phase shifting

Kim, D; You, JW; Kim, Soohyunresearcher, OPTICS EXPRESS, v.14, no.1, pp.229 - 234, 2006-01

Discover

Type

. next

Open Access

Date issued

Subject

. next

rss_1.0 rss_2.0 atom_1.0