Browse "Dept. of Mechanical Engineering(기계공학과)" bySubjectPROFILOMETRY

Showing results 8 to 13 of 13

Simultaneous 3-D Surface Profiling of Multiple Targets by Repetition Rate Scanning of a Single Femtosecond Laser

Lu, Yang; Park, Jiyong; Bian, Dian; Yu, Liandong; Kim, Seung-Wooresearcher, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.21, no.2, pp.211 - 217, 2020-02

Spectrally resolved phase-shifting interference microscopy: technique based on optical coherence tomography for profiling a transparent film on a patterned substrate

Debnath, Sanjit K.; Kim, Seung-Wooresearcher; Kothiyal, Mahendra P.; Hariharan, Parameswaran, APPLIED OPTICS, v.49, no.34, pp.6624 - 6629, 2010-12

Thickness-profile measurement of transparent thin-film layers by white-light scanning interferometry

Kim, Seung-Wooresearcher; Kim, GH, APPLIED OPTICS, v.38, no.28, pp.5968 - 5973, 1999-10

Thin-film thickness profile and its refractive index measurements by dispersive white-light interferometry

Ghim, Young-Sik; Kim, Seung-Wooresearcher, OPTICS EXPRESS, v.14, no.24, pp.11885 - 11891, 2006-11

Time-of-flight detection of femtosecond laser pulses for precise measurement of large microelectronic step height

Lu, Xing; Zhang, Shuangyou; Jeon, Chan-Gi; Kang, Chu-Shik; Kim, Jungwonresearcher; Shi, Kebin, OPTICS LETTERS, v.43, no.7, pp.1447 - 1450, 2018-04

White light on-axis digital holographic microscopy based on spectral phase shifting

Kim, D; You, JW; Kim, Soohyunresearcher, OPTICS EXPRESS, v.14, no.1, pp.229 - 234, 2006-01



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