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Showing results 1 to 5 of 5

1
Absolute distance measurement by dual-comb interferometry with adjustable synthetic wavelength

Lee, Joo-Hyung; Han, Seongheum; Lee, Keun-Woo; Bae, Eun Deok; Kim, Seung-Man; Lee, Sang-Hyun; Kim, Seung-Woo; et al, MEASUREMENT SCIENCE & TECHNOLOGY, v.24, no.4, 2013-04

2
Absolute Distance Meter Operating on a Free-Running Mode-Locked Laser for Space Mission

Jang, Yoon-Soo; Kim, Wooram; Jang, Heesuk; Kim, Seung-Woo, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.19, no.7, pp.975 - 981, 2018-07

3
Comb-referenced laser distance interferometer for industrial nanotechnology

Jang, Yoon-Soo; Wang, Guochao; Hyun, Sang-Won; Kang, Hyun Jay; Chun, Byung Jae; KIM, Young-Jin; Kim, Seung-Woo, SCIENTIFIC REPORTS, v.6, 2016-08

4
Frequency-comb-referenced multi-wavelength profilometry for largely stepped surfaces

Hyun, Sang-Won; Choi, Min-Ah; Chun, Byung-Jae; Kim, Seung-Man; Kim, Seung-Woo; KIM, Young-Jin, OPTICS EXPRESS, v.21, no.8, pp.9780 - 9791, 2013-04

5
Measurement technologies for precision positioning

Gao, W.; Kim, Seung-Woo; Bosse, H.; Haitjema, H.; Chena, Y. L.; Lu, X. D.; Knapp, W.; et al, CIRP ANNALS-MANUFACTURING TECHNOLOGY, v.64, no.2, pp.773 - 796, 2015-06

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