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Development of the integrated measuring system of strain distribution and defect using ESPI & shearography Kim, Hyun-Jun; Gweon, Dae-Gab; Kim, Hyun-Chul, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.13, no.11, pp.1931 - 1939, 2012-11 |
공간주파수 필터링을 이용한 디스플레이 소자의 빠른 패턴 검사 = Rapid defect inspection of display device with optical spatial filteringlink 윤동선; Yoon, Dong-Seon; et al, 한국과학기술원, 2002 |
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