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Showing results 1 to 7 of 7

1
Frequency-comb-referenced multi-wavelength profilometry for largely stepped surfaces

Hyun, Sang-Won; Choi, Min-Ah; Chun, Byung-Jae; Kim, Seung-Man; Kim, Seung-Woo; KIM, Young-Jin, OPTICS EXPRESS, v.21, no.8, pp.9780 - 9791, 2013-04

2
High precision laser ranging by time-of-flight measurement of femtosecond pulses

Lee, Joo-Hyung; Lee, Keun-Woo; Lee, Sang-Hyun; Kim, Seung-Woo; KIM, Young-Jin, MEASUREMENT SCIENCE & TECHNOLOGY, v.23, no.6, 2012-06

3
Measurement technologies for precision positioning

Gao, W.; Kim, Seung-Woo; Bosse, H.; Haitjema, H.; Chena, Y. L.; Lu, X. D.; Knapp, W.; et al, CIRP ANNALS-MANUFACTURING TECHNOLOGY, v.64, no.2, pp.773 - 796, 2015-06

4
Metrological atomic force microscopy integrated with a modified two-point diffraction interferometer

Jin, Jonghan; Rhee, Hyug-Gyo; Kim, Seung-Woo, MEASUREMENT SCIENCE & TECHNOLOGY, v.20, no.10, 2009

5
Open-Air Testing of Dual-Comb Time-of-Flight Measurement

Kim, Wooram; Yang, Jaewon; Jang, Jaeyoung; Oh, Jeong Seok; Han, Seongheum; Kim, Seungman; Jang, Heesuk; et al, SENSORS, v.23, no.21, 2023-11

6
Thin-film thickness profile and its refractive index measurements by dispersive white-light interferometry

Ghim, Young-Sik; Kim, Seung-Woo, OPTICS EXPRESS, v.14, no.24, pp.11885 - 11891, 2006-11

7
Time-of-flight measurement with femtosecond light pulses

Lee, Joo-Hyung; KIM, Young-Jin; Lee, Keun-Woo; Lee, Sang-Hyun; Kim, Seung-Woo, NATURE PHOTONICS, v.4, no.10, pp.716 - 720, 2010-10

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