Browse "Dept. of Mechanical Engineering(기계공학과)" by Subject FLUORESCENCE MICROSCOPY
Showing results 1 to 7 of 7
| ABERRATION CORRECTED BEAM SCANNING STIMULATED EMISSION DEPLETION MICROSCOPY Yoo, Hongki; Song, Incheon; Gweon, Dae-Gab, INTERNATIONAL JOURNAL OF OPTOMECHATRONICS, v.2, no.4, pp.401 - 412, 2008 |
| Contour Offset Algorithm (COA) in nano Replication Printing (nRP) for fabricating nano-precision features Lim, TW; Park, SH; Yang, Dong-Yol; Yi, SW; Kong, Hong-Jin; Lee, KS, JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY, v.19, pp.2105 - 2111, 2005-11 |
| Design and analysis of a cross-type structured-illumination confocal microscope for high speed and high resolution Kim, Young-Duk; Ahn, Myoung-Ki; Kim, Tae-Joong; Yoo, Hong-Ki; Gweon, Dae-Gab, MEASUREMENT SCIENCE & TECHNOLOGY, v.23, no.10, 2012-10 |
| Improvement of the axial resolution in confocal microscopy by the use of heterodyne interference Lee, Seungwoo; Gweon, Dae-Gab, MEASUREMENT SCIENCE & TECHNOLOGY, v.19, no.10, 2008-10 |
| Quantitative displacement measurement of a nanotube cantilever with nanometer accuracy using epifluorescence microscopy Park, Hyojun; Kwon, Soongeun; Kim, Soohyun, REVIEW OF SCIENTIFIC INSTRUMENTS, v.80, no.5, 2009 |
| SNR enhanced high-speed two-photon microscopy using a pulse picker and time gating detection Song, Jeonggeun; Kang, Juehyung; Kang, Ungyo; Nam, Hyeong Soo; Kim, Hyun Jung; Kim, Ryeong Hyeon; Kim, Jin Won; et al, SCIENTIFIC REPORTS, v.13, no.1, 2023-08 |
| Three-dimensional confocal reflectance microscopy for surface metrology Kim, Chang-Soo; Yoo, Hongki, MEASUREMENT SCIENCE AND TECHNOLOGY, v.32, no.10, 2021-10 |
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