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Equivalent Standard Deviation to Convert High-Reliability Model to Low-Reliability Model for Efficiency of Sampling-Based RBDO Lee, IkJin; Choi, Kyung K; David, Gorsich, ASME IDETC/DAC, ASME, 2011-08-29 |
Sampling-Based Stochastic Sensitivity Analysis Using Score functions for RBDO problems with Correlated Random Variables Lee, IkJin; Choi, Kyung K; Noh, Yoojeong; Liang, Zhao; David, Gorsich, ASME IDETC/DAC, ASME, 2010-08-16 |
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