Showing results 2 to 4 of 4
Machine Straightness Error Measurement Based on Optical Fiber Fabry-Perot Interferometer Monitoring Technique Fu, Xingyu; Zhou, Fengfeng; Yun, Huitaek; Kim, Eunseob; Chen, Siying; Jun, Martin Byung-Guk, JOURNAL OF MANUFACTURING SCIENCE AND ENGINEERING-TRANSACTIONS OF THE ASME, v.145, no.1, 2023-01 |
Optical inspection of complex patterns of microelectronics products You, J.; Kim, Seung-Woo, CIRP ANNALS-MANUFACTURING TECHNOLOGY, v.57, no.1, pp.505 - 508, 2008 |
Simultaneous measurement method of total and self-interference for the volumetric thickness-profilometer You, JW; Kim, D; Ryu, SY; Kim, Soohyun, OPTICS EXPRESS, v.17, no.3, pp.1352 - 1360, 2009-02 |
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