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A simple terahertz time-domain signal reconstruction algorithm for thickness measurement in real-world applications Lee, Jinwoo; Kim, Soohyun, MEASUREMENT, v.151, 2020-02 |
Accurate thickness measurement using a single terahertz pulse obtained in ambient atmosphere Lee, Jinwoo; Choi, Jindoo; Kim, Soohyun, OPTICS COMMUNICATIONS, v.462, 2020-05 |
Large-area thickness measurement of transparent multi-layer films based on laser confocal reflection sensor Choi, Young-Man; Yoo, Hongki; Kang, Dongwoo, MEASUREMENT, v.153, 2020-03 |
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