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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Analysis of Critical Race Combined Circuit with Timed Discrete Event Model

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Lee, MS / Cho, Kwang-Hyunresearcher / Lim, Jong-Taeresearcher
Issue Date
1999-10
Language
ENG
Citation

4th International Conference On Mechatronic Technology, pp.538 - 540

URI
http://hdl.handle.net/10203/127015
Appears in Collection
BiS-Conference Papers(학술회의논문)EE-Conference Papers(학술회의논문)
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