X-ray laminographic application of lens-coupled CMOS detector for PCB inspection

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Issue Date
2001-11-04
Language
ENG
Citation

2001 IEEE Nuclear Science Symposium Conference Record, v.3, pp.1620 - 1623

URI
http://hdl.handle.net/10203/126950
Appears in Collection
NE-Conference Papers(학술회의논문)
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