Numerical Analysis for conductance Probes for the Measurement of Liquid Film Thickness in Two-Phase Flow
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | No, Hee Cheon | - |
| dc.contributor.author | Mayinger, F | - |
| dc.date.accessioned | 2013-03-15T19:03:40Z | - |
| dc.date.available | 2013-03-15T19:03:40Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1995 | - |
| dc.identifier.citation | 한국원자력학회 추계발표회, v., no., pp.450 - 455 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/122750 | - |
| dc.language | KOR | - |
| dc.title | Numerical Analysis for conductance Probes for the Measurement of Liquid Film Thickness in Two-Phase Flow | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 450 | - |
| dc.citation.endingpage | 455 | - |
| dc.citation.publicationname | 한국원자력학회 추계발표회 | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | No, Hee Cheon | - |
| dc.contributor.nonIdAuthor | Mayinger, F | - |
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