Numerical Analysis for conductance Probes for the Measurement of Liquid Film Thickness in Two-Phase Flow

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dc.contributor.authorNo, Hee Cheon-
dc.contributor.authorMayinger, F-
dc.date.accessioned2013-03-15T19:03:40Z-
dc.date.available2013-03-15T19:03:40Z-
dc.date.created2012-02-06-
dc.date.issued1995-
dc.identifier.citation한국원자력학회 추계발표회, v., no., pp.450 - 455-
dc.identifier.urihttp://hdl.handle.net/10203/122750-
dc.languageKOR-
dc.titleNumerical Analysis for conductance Probes for the Measurement of Liquid Film Thickness in Two-Phase Flow-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage450-
dc.citation.endingpage455-
dc.citation.publicationname한국원자력학회 추계발표회-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthorNo, Hee Cheon-
dc.contributor.nonIdAuthorMayinger, F-
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NE-Conference Papers(학술회의논문)
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