DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Dae Sik | - |
dc.contributor.author | Seong, Poong-Hyun | - |
dc.date.accessioned | 2013-03-15T17:37:44Z | - |
dc.date.available | 2013-03-15T17:37:44Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1997-05 | - |
dc.identifier.citation | Maintenance And Reliability Conference, v., no., pp.24 - 24 | - |
dc.identifier.uri | http://hdl.handle.net/10203/121917 | - |
dc.language | ENG | - |
dc.title | Compact Test Generation Of Robustly Hazard-Free Tests For Path Delay Fault In Combinational Circuits Using 19-Valued Logic | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 24 | - |
dc.citation.endingpage | 24 | - |
dc.citation.publicationname | Maintenance And Reliability Conference | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Seong, Poong-Hyun | - |
dc.contributor.nonIdAuthor | Kim, Dae Sik | - |
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