A Simple Model and Computer Simulation Results of Accumulation of Charge in Thin SiO2 Films Under Fowler-Nordheim Injection and Time to Breakdown in High Fields

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Issue Date
1996
Language
ENG
Citation

International Conference on Simulation of Devices and Technologies, pp.57 - 63

URI
http://hdl.handle.net/10203/121916
Appears in Collection
EE-Conference Papers(학술회의논문)
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