Yield Management in Semiconductor Manufacturing Using Hybrid System of Case Based reasoning and Neural Networks

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dc.contributor.authorPark, Sang Chan-
dc.date.accessioned2013-03-15T15:24:20Z-
dc.date.available2013-03-15T15:24:20Z-
dc.date.created2012-02-06-
dc.date.issued1998-
dc.identifier.citationInt'l Symp. on Manufacturing Strategy, v., no., pp.136 - 141-
dc.identifier.urihttp://hdl.handle.net/10203/120733-
dc.languageENG-
dc.titleYield Management in Semiconductor Manufacturing Using Hybrid System of Case Based reasoning and Neural Networks-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage136-
dc.citation.endingpage141-
dc.citation.publicationnameInt'l Symp. on Manufacturing Strategy-
dc.identifier.conferencecountryJapan-
dc.identifier.conferencecountryJapan-
dc.contributor.localauthorPark, Sang Chan-
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