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Probabilistic relationship between Q-value and electrical resistivity Ryu, Hee-Hwan; Oh, Tae-Min; Cho, Gye-Chun; Kim, Kyoung-Yul; Lee, Kang-Ryel; Lee, Dae-Soo, KSCE JOURNAL OF CIVIL ENGINEERING, v.18, no.3, pp.780 - 786, 2014-04 |
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