DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Seung-Woo | - |
dc.contributor.author | Lee Sang-Yoon | - |
dc.contributor.author | Yoon Dong-Seon | - |
dc.contributor.author | Hong Chul-Ki | - |
dc.contributor.author | Hong Ji-Jung | - |
dc.date.accessioned | 2013-03-15T09:57:16Z | - |
dc.date.available | 2013-03-15T09:57:16Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1997-01-29 | - |
dc.identifier.citation | Proceedings of the 1997 Display Manufacturing Technology Conference, v., no., pp.19 - 20 | - |
dc.identifier.uri | http://hdl.handle.net/10203/118453 | - |
dc.language | ENG | - |
dc.title | Rapid pattern inspection of shadow masks by machine vision integrated with Fourier optics | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-0031385901 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 19 | - |
dc.citation.endingpage | 20 | - |
dc.citation.publicationname | Proceedings of the 1997 Display Manufacturing Technology Conference | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Kim, Seung-Woo | - |
dc.contributor.nonIdAuthor | Lee Sang-Yoon | - |
dc.contributor.nonIdAuthor | Yoon Dong-Seon | - |
dc.contributor.nonIdAuthor | Hong Chul-Ki | - |
dc.contributor.nonIdAuthor | Hong Ji-Jung | - |
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