DC Field | Value | Language |
---|---|---|
dc.contributor.author | Castro, T | - |
dc.contributor.author | Li, YZ | - |
dc.contributor.author | Reifenberger, R | - |
dc.contributor.author | Choi, E | - |
dc.contributor.author | Park, SeungBin | - |
dc.contributor.author | Andres, RP | - |
dc.date.accessioned | 2013-03-14T22:59:40Z | - |
dc.date.available | 2013-03-14T22:59:40Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1990 | - |
dc.identifier.citation | ACS Symposium Series 437, v., no., pp.329 - 341 | - |
dc.identifier.uri | http://hdl.handle.net/10203/114291 | - |
dc.language | ENG | - |
dc.publisher | ACS Symposium | - |
dc.title | Scanning electron and field emission microscopy of supported metal clusters | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 329 | - |
dc.citation.endingpage | 341 | - |
dc.citation.publicationname | ACS Symposium Series 437 | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Park, SeungBin | - |
dc.contributor.nonIdAuthor | Castro, T | - |
dc.contributor.nonIdAuthor | Li, YZ | - |
dc.contributor.nonIdAuthor | Reifenberger, R | - |
dc.contributor.nonIdAuthor | Choi, E | - |
dc.contributor.nonIdAuthor | Andres, RP | - |
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