Tetra-sigma bonding adsorption of pyridine on Si(100)-2x1

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We studied adsorption of pyridine on Si(100) at room temperature using high resolution photoemission spectroscopy (PES) and near edge X-ray adsorption fine structure (NEXAFS) in the partial electron yield (PEY) mode. The Si 2p, C 1s, N 1s spectra of pyridine on Si(100) showed that pyridine is chemisorbed on Si(100)-2 x 1 through the formation of the tetra-sigma-bonded structure with the N atom and three C atoms. NEXAFS was conducted to characterize the adsorption geometry of pyridine on Si(100). The pi* orbital of C=C bond showed a good angle dependence in C K-edge NEXAFS spectra, and we were able to estimate the adsorption angle between chemisorbed pyridine of C=C bond and the Si(100) Surface using an analytical solution of NEXAFS intensity. We find the coexistence of two different tight bridges with the adsorption angles 42 +/- 21 degrees and 45 +/- 21 degrees with almost equal abundance. (C) 2008 Elsevier B.V. All rights reserved.
Publisher
ELSEVIER SCIENCE BV
Issue Date
2008-07
Language
English
Article Type
Article
Keywords

SPECTROSCOPY; SURFACES; PYRROLE; X-1; PHOTOEMISSION; TEMPERATURE; ELECTRONICS; BEAMLINE; FILMS

Citation

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, v.164, no.1-3, pp.44 - 47

ISSN
0368-2048
DOI
10.1016/j.elspec.2008.05.005
URI
http://hdl.handle.net/10203/11366
Appears in Collection
CH-Journal Papers(저널논문)
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