Subtheshold Picosecond Laser Damage in Silicon Associated with Charge Emission

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dc.contributor.authorJhee, Youn Kyu-
dc.date.accessioned2013-03-14T20:08:53Z-
dc.date.available2013-03-14T20:08:53Z-
dc.date.created2012-02-06-
dc.date.issued1984-
dc.identifier.citationIn Ultrafast Phenomena IV, Springer Series in Chemical Physics 38, Springer-Verlag, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/112771-
dc.languageENG-
dc.titleSubtheshold Picosecond Laser Damage in Silicon Associated with Charge Emission-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameIn Ultrafast Phenomena IV, Springer Series in Chemical Physics 38, Springer-Verlag-
dc.contributor.localauthorJhee, Youn Kyu-
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