Subtheshold Picosecond Laser Damage in Silicon Associated with Charge Emission
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jhee, Youn Kyu | - |
| dc.date.accessioned | 2013-03-14T20:08:53Z | - |
| dc.date.available | 2013-03-14T20:08:53Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1984 | - |
| dc.identifier.citation | In Ultrafast Phenomena IV, Springer Series in Chemical Physics 38, Springer-Verlag, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/112771 | - |
| dc.language | ENG | - |
| dc.title | Subtheshold Picosecond Laser Damage in Silicon Associated with Charge Emission | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | In Ultrafast Phenomena IV, Springer Series in Chemical Physics 38, Springer-Verlag | - |
| dc.contributor.localauthor | Jhee, Youn Kyu | - |
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