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Comprehensive study of time-lapsed peak shift in InGaN quantum well structures: Discrimination of localization effect from internal field effect Son, J. K.; Sakong, T.; Lee, S. N.; Paek, H. S.; Ryu, H.; Ha, K. H.; Nam, O.; et al, APPLIED PHYSICS LETTERS, v.90, no.5, 2007-01 |
Measurement of optical loss variation on thickness of InGaN optical confinement layers of blue-violet-emitting laser diodes Son, J. K.; Lee, S. N.; Paek, H. S.; Sakong, T.; Kim, H. K.; Park, Y.; Ryu, H. Y.; et al, JOURNAL OF APPLIED PHYSICS, v.103, no.10, 2008-05 |
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