E-PLOT : A New Method Characterizing the Substrate Current and the Saturation Voltage of Fresh and Hot-Electron Stressed nMOSFET
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kwyro Lee | - |
| dc.contributor.author | Kim, Shi Ho | - |
| dc.date.accessioned | 2013-03-14T06:04:25Z | - |
| dc.date.available | 2013-03-14T06:04:25Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1994 | - |
| dc.identifier.citation | 대한전자공학회 학술대회 , v., no., pp.119 - 120 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/105956 | - |
| dc.language | KOR | - |
| dc.publisher | 대한전자공학회 | - |
| dc.title | E-PLOT : A New Method Characterizing the Substrate Current and the Saturation Voltage of Fresh and Hot-Electron Stressed nMOSFET | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 119 | - |
| dc.citation.endingpage | 120 | - |
| dc.citation.publicationname | 대한전자공학회 학술대회 | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | Kwyro Lee | - |
| dc.contributor.nonIdAuthor | Kim, Shi Ho | - |
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- EE-Conference Papers(학술회의논문)
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