E-PLOT : A New Method Characterizing the Substrate Current and the Saturation Voltage of Fresh and Hot-Electron Stressed nMOSFET

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Publisher
대한전자공학회
Issue Date
1994
Language
KOR
Citation

대한전자공학회 학술대회 , pp.119 - 120

URI
http://hdl.handle.net/10203/105956
Appears in Collection
EE-Conference Papers(학술회의논문)
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