Showing results 1 to 12 of 12
Classifying False Positive Static Checker Alarms in Continuous Integration Using Convolutional Neural Networks Lee, Seongmin; Hong, Shin; Yi, Jungbae; Kim, Taeksu; Kim, Chul-Joo; Yoo, Shin, 2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST), pp.391 - 401, IEEE, 2019-04-26 |
Detecting Concurrency Errors in Client-side JavaScript Web Applications Hong, Shin; Park, Yongbae; Kim, Moonzoo, International Conference on Software Testing, Verification and Validation (ICST), IEEE Computer Society, 2014-04-01 |
Empirical Study of Effectiveness of EvoSuite on the SBST 2020 Tool Competition Benchmark Herlim, Robert Sebastian; Hong, Shin; Kim, Yunho; Kim, Moonzoo, 13th International Symposium on Search-Based Software Engineering, SSBSE 2021, pp.121 - 135, Springer Science and Business Media Deutschland GmbH, 2021-10-11 |
Invasive Software Testing: Mutating Target Programs to Diversify Test Exploration for High Test Coverage Kim, Yunho; Hong, Shin; Ko, Bongsuk; Phan Duy Loc; Kim, Moonzoo, IEEE Conference on Software Testing, Validation and Verification (ICST), pp.239 - 249, IEEE(Computer Society), 2018-04-11 |
Model-based Kernel Testing for Concurrency Bugs through Counter Example Replay Kim, Moonzoo; Hong, Shin; Hong, Changki; Kim, Taeho, Model-based Testing (ENTCS), pp.21 - 36, Model-based Testing (ENTCS), 2009-05-22 |
Mutation-based Fault Localization for Real-world Multilingual Programs Hong, Shin; Lee, Byeongcheol; Kwak, Taehoon; Jeon, Yiru; Ko, Bongsuk; Kim, Yoonho; Kim, Moonzoo, International Conference on Automated Software Engineering, IEEE Computer Society and ACM SIGSFOT, 2015-11-12 |
Repairing Fragile GUI Test Cases Using Word and Layout Embedding Yoon, Juyeon; Chung, Seungjoon; Shin, Kihyuck; Kim, Jinhan; Hong, Shin; Yoo, Shin, International Conference on Software Testing, Verification and Validation, ICST 2022, pp.291 - 301, Institute of Electrical and Electronics Engineers Inc., 2022-04-07 |
Systematic Testing of Reactive Software with Non-deterministic Events: A Case Study on LG Electric Oven Park, Yongbase; Hong, Shin; Kim, Moonzoo; Lee, Dongju; Cho, Junhee, International Conference on Software Engineering (ICSE), IEEE Computer Society and ACM SIGSOFT, 2015-05-20 |
Target-driven compositional concolic testing with function summary refinement for effective bug detection Kim, Yunho; Hong, Shin; Kim, Moonzoo, 27th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, ESEC/FSE 2019, pp.16 - 26, Association for Computing Machinery, Inc, 2019-08-29 |
Testing Concurrent Programs to Achieve High Synchronization Coverage Hong, Shin; Ahn, Jaemin; Park, Sangmin; Kim, Moonzoo; Harrold, Mary-Jean, International Symposium on Software Testing and Analysis, ACM, 2012-07-18 |
The Impact of Concurrent Coverage Metrics on Testing Effectiveness Hong, Shin; Staats, Matthew; Ahn, Jaemin; Kim, Moonzoo; Rothermel, Gregg, International Conference on Software Testing, Verification and Validation (ICST), IEEE, 2013-03-20 |
Understanding User Understanding: Determining Correctness of Generated Program Invariants Staats, Matthew; Hong, Shin; Kim, Moonzoo; Rothermel, Gregg, International Symposium on Software Testing and Analysis, ACM, 2012-07-18 |
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