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Showing results 5 to 12 of 12

5
Model-based Kernel Testing for Concurrency Bugs through Counter Example Replay

Kim, Moonzoo; Hong, Shin; Hong, Changki; Kim, Taeho, Model-based Testing (ENTCS), pp.21 - 36, Model-based Testing (ENTCS), 2009-05-22

6
Mutation-based Fault Localization for Real-world Multilingual Programs

Hong, Shin; Lee, Byeongcheol; Kwak, Taehoon; Jeon, Yiru; Ko, Bongsuk; Kim, Yoonho; Kim, Moonzoo, International Conference on Automated Software Engineering, IEEE Computer Society and ACM SIGSFOT, 2015-11-12

7
Repairing Fragile GUI Test Cases Using Word and Layout Embedding

Yoon, Juyeon; Chung, Seungjoon; Shin, Kihyuck; Kim, Jinhan; Hong, Shin; Yoo, Shin, International Conference on Software Testing, Verification and Validation, ICST 2022, pp.291 - 301, Institute of Electrical and Electronics Engineers Inc., 2022-04-07

8
Systematic Testing of Reactive Software with Non-deterministic Events: A Case Study on LG Electric Oven

Park, Yongbase; Hong, Shin; Kim, Moonzoo; Lee, Dongju; Cho, Junhee, International Conference on Software Engineering (ICSE), IEEE Computer Society and ACM SIGSOFT, 2015-05-20

9
Target-driven compositional concolic testing with function summary refinement for effective bug detection

Kim, Yunho; Hong, Shin; Kim, Moonzoo, 27th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, ESEC/FSE 2019, pp.16 - 26, Association for Computing Machinery, Inc, 2019-08-29

10
Testing Concurrent Programs to Achieve High Synchronization Coverage

Hong, Shin; Ahn, Jaemin; Park, Sangmin; Kim, Moonzoo; Harrold, Mary-Jean, International Symposium on Software Testing and Analysis, ACM, 2012-07-18

11
The Impact of Concurrent Coverage Metrics on Testing Effectiveness

Hong, Shin; Staats, Matthew; Ahn, Jaemin; Kim, Moonzoo; Rothermel, Gregg, International Conference on Software Testing, Verification and Validation (ICST), IEEE, 2013-03-20

12
Understanding User Understanding: Determining Correctness of Generated Program Invariants

Staats, Matthew; Hong, Shin; Kim, Moonzoo; Rothermel, Gregg, International Symposium on Software Testing and Analysis, ACM, 2012-07-18

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