Recently Added Documents

21 Estimating Vr Sickness Caused By Camera Shake In Vr Videography

Kim, Seongyeop; Lee, Sangmin; Ro, Yong Manresearcher
IEEE Signal Processing Society, 2020-10-25

22 Comprehensive Facial Expression Synthesis Using Human-Interpretable Language

Hong, Joanna; Kim, Jung Uk; Lee, Sangmin; Ro, Yong Manresearcher
IEEE Signal Processing Society, 2020-10-25

23 Learning Style Correlation For Elaborate Few-Shot Classification

Kim, Junho; Kim, Minsu; Kim, Jung Uk; Lee, Hong Joo; Lee, Sangmin; Hong, Joanna; Ro, Yong Manresearcher
IEEE Signal Processing Society, 2020-10-25

24 Fake Video Detection With Certainty-Based Attention Network

Choi, Dae Hwi; Lee, Hong Joo; Lee, Sangmin; Kim, Jung Uk; Ro, Yong Manresearcher
IEEE Signal Processing Society, 2020-10-25

25 Observation of domain wall segment jump among disorders

Taniguchi, Takuya; Koyama, Tomohiro; Kim, Kyoung-Hoon; Chiba, Daichi; Kim, Kab-Jinresearcher; Ono, Teruo
ELSEVIER, vol. 511, pp. 166999, 2020-10

26 Modeling regulatory networks using machine learning for systems metabolic engineering

Kwon, Mun Su; Lee, Byung Tae; Lee, Sang Yupresearcher; Kim, Hyun Ukresearcher
Elsevier Ltd, vol. 65, pp. 163 - 170, 2020-10

27 Tuning surface functionalities of sub-10 nm-sized nanocarriers to target outer retina in designing drug delivery agents for intravitreal administration

You, Suyeon; Kim, Hyoungtai; Jung, Hye-youn; Kim, Boram; Lee, Eun Jung; Kim, Jin Wooresearcher; Kim, Yoonkyung
ELSEVIER SCI LTD, vol. 255, 2020-10

28 Promoting lithium electrodeposition towards the bottom of 3-D copper meshes in lithium-based batteries

Kim, Sujung; Kim, Yena; Nguyen, Chi Thang; Jang, Taegyu; Lee, Han-Bo-Ram; Byon, Hye Ryungresearcher
ELSEVIER, vol. 472, pp. 228495, 2020-10 View PDF (7613kb)

29 Microbial production of fatty acids and derivative chemicals

Cho, Injin; Choi, Kyeong Rok; Lee, Sang Yupresearcher
Elsevier Ltd, vol. 65, pp. 129 - 141, 2020-10

30 Robust Loop Closure Method for Multi-Robot Map Fusion by Integration of Consistency and Data Similarity

Do, Haggi; Hong, Seonghun; Kim, Jinwhanresearcher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, vol. 5, no. 4, pp. 5701 - 5708, 2020-10

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