| 128721 | Microstrucature and Electrical Properties of RuO2 based Thick Film Resistros B.K.Koo; H.G.Kim, 한국세라믹학회지, v.27, no.30, pp.337 - 344, 1990 |
| 128722 | Microstructual study on mechanical properties of MEMS materials Hong, Soon Hyung, In celebration of the 60th anniversary proceedings of the KSME 2005 spring annual meeting, 2005-05-26 |
| 128723 | Microstructural alteration of calcium sulfoaluminate cement-based materials exposed to accelerated carbonation conditions = 가속탄산화 조건에 폭로된 칼슘 설포알루미네이트 시멘트 기반 물질의 미세구조 변화link Seo, Joonho; Lee, Haeng-Ki; et al, 한국과학기술원, 2022 |
| 128724 | Microstructural Analyses of Soyprotein Fibers Kim J. C.; Cho. S. J.; Byun P. H.; Byun Si Myung, 한국응용생명화학회지(한국농화학회지), v.34, no.4, pp.353 - 359, 1991 |
| 128725 | Microstructural analysis of Ga-doped ZnO films grown on (0001) Al2O3 substrates by RF magnetron sputtering Lee, Jeong Yong; Lee, JH; Kim, YY; Cho, HK, 2nd International Conference on Microelectronics and Plasma Technology, 2009-09-22 |
| 128726 | Microstructural Analysis of In Doped Ge-Sb-Te Thin Films using High Voltage Electron Microscopy Lee, Jeong Yong, The 9th Asia-Pacific Microscopy Conference, 2008-11-02 |
| 128727 | Microstructural Analysis of Nanostructured Thin Films of Self-assembled Macromolecules Jung, HeeTae, 12th Annual Polychar World Forum on advanced Materials, pp.0 - 0, 2004-01-01 |
| 128728 | Microstructural Analysis of OPC/Silica Fume/Na-Bentonite Interactions in Cement Based Solidification of Organic-Contaminated Hazardous Waste Shin, Hang-Sik, JOURNAL OF ENVIRONMENTAL SCIENCE AND HEALTH PART A-TOXIC/HAZARDOUS SUBSTANCES & ENVIRONMENTAL ENGINEERING, v.32, no.4, pp.913 - 928, 1997-01 |
| 128729 | Microstructural analysis of RF-sputtered Ge-Bi-Te ternary chalcogenide alloy for phase change memory application Lee, Jeong Yong, Microscopy and Microanalysis 2007 meeting, 2007-08-05 |
| 128730 | Microstructural Analysis of Sb-Se-Te Thin Films Crystallization by Using in Situ High Voltage Electron Microscopy Lee, Jeong Yong, The 9th Asia-Pacific Microscopy Conference, 2008-11-02 |
| 128731 | Microstructural Analysis of Solid Oxide Electrochemical Cells via 3D Reconstruction Using a FIB-SEM Dual Beam System Jang, Seungsoo; Lee, Kang Taek, 243rd ECS meeting, the american ceramic society, 2023-05-29 |
| 128732 | Microstructural Analysis of Supramolecular Liquid Crystalline Mesophases by Scattering and TEM methods Jung, HeeTae, The Polymer Society of Korea fall meting, The Polymer Society of Korea, 2003 |
| 128733 | Microstructural Analysis of Void Formation Due to a NH4Cl Layer for Self-Separation of GaN Thick Films Lee, Hyun-Jae; Ha, Jun-Seok; Yao, Takafumi; Kim, Chinkyo; Hong, Soon-Ku; Chang, Jiho; Lee, Jae Wook; et al, CRYSTAL GROWTH & DESIGN, v.9, no.6, pp.2877 - 2880, 2009-06 |
| 128734 | Microstructural analysis of ZnO-ZnS Heterostructures fabricated by a low temperature sulfidation process = 저온 황화과정으로 생성된 ZnO-ZnS 이종구조의 미세구조 특성 연구link Ahn, Hung-Bae; 안흥배; et al, 한국과학기술원, 2014 |
| 128735 | Microstructural analysis of ZnO/ZnS nanocables through Moire fringe induced by overlapped area of ZnO and ZnS Sun, CW; Jeong, JS; Lee, JeongYong, JOURNAL OF CRYSTAL GROWTH, v.294, pp.162 - 167, 2006-09 |
| 128736 | Microstructural Analysis Upon Annealing Temperature in In-Sb-Te Thin Films Deposited by RF Magnetron Sputtering Kim ChungSoo; Kim EunTae; Lee JeongYong, 2010 Materials Research Society Spring Meeting, 2010-04-07 |
| 128737 | Microstructural and compositional modification of In0.53Ga0.47As/In0.52Al0.48As multiquantum wells using rapid thermal annealing process Jang, Y. O.; Lee, JeongYong, MATERIALS SCIENCE AND TECHNOLOGY, v.27, no.8, pp.1299 - 1302, 2011-08 |
| 128738 | Microstructural and electrical characteristics of indium-antimony-tellurium chalcogenide alloys for application in phase change memory = 상변화 메모리 응용을 위한 InSbTe 칼코게나이드 화합물의 미세구조와 전기적 특성에 관한 연구link Kim, Eun-Tae; 김은태; et al, 한국과학기술원, 2010 |
| 128739 | Microstructural and electrical investigation of low resistance and thermally stable Pd/Ni contact on p-type GaN Jang, HW; Cho, HK; Lee, JeongYong; Lee, JL, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.150, pp.G212 - G215, 2003-03 |
| 128740 | Microstructural and electrical properties of lead-free 0.5Ba(Zr0.2Ti0.8)O-3-0.5(Ba0.7Ca0.3)TiO3 (BZT-BCT) epitaxial films grown on Si (001) substrates Choi, Min-Ju; Lim, Jae-Ryung; Choi, Jin-Suck; Eom, Ji-Ho; Park, Byung-Ju; Kim, Kyung-Soo; Kim, Dojin; et al, SCRIPTA MATERIALIA, v.108, pp.96 - 99, 2015-11 |
