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Effect of thermal annealing on the formation of preferential c-axis orientation and an interfacial layer for ZnO thin films grown on an n-Si (001) substrate

Yuk, Jong Minresearcher; Shin, J. W.; Lee, Jeong-Yongresearcher; Son, D. I.; Jung, J. H.; Kim, T. W.; Kim, J. Y.; et al, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.50, no.3, pp.608 - 611, 2007-03



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