Browse bySubject1/f noise parameter

Showing results 1 to 3 of 3

Bolometric properties of reactively sputtered TiO2-x films for thermal infrared image sensors

Reddy, Y. Ashok Kumar; Kang, In-Ku; Shin, Young Bong; Lee, Hee Chulresearcher, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.48, no.35, 2015-09

Substrate temperature dependent bolometric properties of TiO2-x films for infrared image sensor applications

Reddy, Y. Ashok Kumar; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chulresearcher, CERAMICS INTERNATIONAL, v.42, no.15, pp.17123 - 17127, 2016-11

마이크로 볼로미터의 감지 물질로 사용되는 외인성 도핑된 티타늄 산화막에 관한 연구 = A study on extrinsic doped titanium oxide film for the microbolometer sensing materiallink

신영봉; Shin, Youngbong; et al, 한국과학기술원, 2015



. next

Open Access

Date issued

. next


. next

rss_1.0 rss_2.0 atom_1.0