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A Small Space Radiation Monitor Capable of Measuring Multiple I-SD-V-GS Values of MOSFET Seon J.; Kim S.-J.; Sung B.-I.; Al Marri S.; Lee S.-H., JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, v.47, no.4, pp.340 - 344, 2010 |
Reliability Improvement of Gate-All-Around SONOS Memory by Joule Heat From Gate-Induced Drain Leakage Current Lee, Jung-Woo; Han, Joon-Kyu; Yu, Ji-Man; Lee, Geon-Beom; Tcho, Il-Woong; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.69, no.1, pp.115 - 119, 2022-01 |
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