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Showing results 1 to 3 of 3

1
LF Noise Analysis for Trap Recovery in Gate Oxides Using Built-In Joule Heater

Jeon, Chang-Hoon; Kim, Choong-Ki; Park, Jun-Young; Jeong,Ui-Sik; Lee, Byung-Hyun; Kim, Kyung Rok; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.12, pp.5081 - 5086, 2017-12

2
Low-Frequency Noise Characteristics in SONOS Flash Memory With Vertically Stacked Nanowire FETs

Bang, Te-Wook; Lee, Byung-Hyun; Kim, Choong-Ki; Ahn, Dae-Chul; Jeon, Seung-Bae; Kang, Min-Ho; Oh, Jae-Sub; et al, IEEE ELECTRON DEVICE LETTERS, v.38, no.1, pp.40 - 43, 2017-01

3
Low-Frequency Noise Characteristics in SONOS Flash Memory with Vertically Stacked Nanowire FETs = 수직 적층 나노와이어 트렌지스터 기반 비휘발성 플래시 메모리에서의 저주파 잡음 특성 분석link

Bang, Tewook; Choi, Yang-Kyu; et al, 한국과학기술원, 2017

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