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Showing results 1 to 7 of 7

1
Characteristics of efficient few-cycle terahertz radiation generated in as-grown nonlinear organic single crystals

Kang, Bong Joo; Baek, In Hyung; Jeong, Jae-Hyeok; Kim, Ji-Soo; Lee, Seung-Heon; Kwon, O-Pil; Rotermund, Fabian Marcel, CURRENT APPLIED PHYSICS, v.14, no.3, pp.403 - 406, 2014-03

2
Characterization of vacuum evaporated polycrystalline Cd0.96Zn0.04Te thin films by XRD, Raman scattering and spectroscopic ellipsometry

Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, CRYSTAL RESEARCH AND TECHNOLOGY, v.37, no.9, pp.964 - 975, 2002

3
Influence of thermal annealing on the structural and optical properties of polycrystalline Cd0.96Zn0.04Te thin films

Sridharan, MG; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, v.7, pp.1483 - 1491, 2005-06

4
Optical constants of vacuum-evaporated Cd0.96Zn0.04Te thin films measured by spectroscopic ellipsometry

Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.13, no.8, pp.471 - 476, 2002-08

5
Paraxial Theory of Direct Electro-optic Sampling of the Quantum Vacuum

Andrey, S. Moskalenko; Riek, C.; Seletskiy, D. V.; Burkard, G.; Leitenstorfer, A., PHYSICAL REVIEW LETTERS, v.115, no.26, pp.263601, 2015-12

6
Raman scattering, photoluminescence and spectroscopic ellipsometry studies on polycrystalline Cd0.96Zn0.04Te thin films

Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF ALLOYS AND COMPOUNDS, v.346, no.1-2, pp.100 - 106, 2002-11

7
Terahertz Frequency Spreading Filter via One-dimensional Dielectric Multilayer Structures

Yi, Min-Woo; Kim, Young-Chan; Yee, Dae-Su; Ahn, Jae-Wook, JOURNAL OF THE OPTICAL SOCIETY OF KOREA, v.13, pp.398 - 402, 2009-09

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