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1
Accelerated Life Tests for Products of Unequal Size

Bai, Do Sun; h.j. yun, IEEE TRANSACTIONS ON RELIABILITY, v.45, no.4, pp.611 - 618, 1996

2
Optimal Design of Partially Accleraated Life Tests for Lognormal Distribution under Type I Censoring

Bai, Do Sun; s. w. chung; y.r. chun, RELIABILITY ENGINEERING AND SYSTEM SAFETY, v.40, no.1, pp.85 - 92, 1993

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