Browse by Subject Inter-layer dielectric

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Investigation of gate length and fringing field effects for program and erase efficiency in gate-all-around SONOS memory cells

Kim, Moon-Seok; Choi, Sung-Jin; Moon, Dong-Il; Duarte, Juan P.; Kim, Sung-Ho; Choi, Yang-Kyuresearcher, SOLID-STATE ELECTRONICS, v.79, pp.7 - 10, 2013-01

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