Showing results 1 to 2 of 2
Characterization of Ag-x(Ge2Sb2Te5)(1-x) thin film by RF magnetron sputtering Kim, Dong Hun; Kim, Myung Sun; Kim, Ran-Young; Kim, Kyung Sun; Kim, Ho Gi, MATERIALS CHARACTERIZATION, v.58, no.5, pp.479 - 484, 2007 |
Structural properties of Ge2Sb2Te5 thin films by metal organic chemical vapor deposition for phase change memory applications Kim, Ran-Young; Kim, Ho Gi; Yoon, Soon-Gil, APPLIED PHYSICS LETTERS, v.89, no.10, 2006-09 |
Discover