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The Effect of Gate and Drain Fields on the Competition Between Donor-Like State Creation and Local Electron Trapping in In-Ga-Zn-O Thin Film Transistors Under Current Stress Choi, Sungju; Kim, Hyeongjung; Jo, Chunhyung; Kim, Hyun-Suk; Choi, Sung-Jin; Kim, Dong Myong; Park, Jozeph; et al, IEEE ELECTRON DEVICE LETTERS, v.36, no.12, pp.1336 - 1339, 2015-12 |
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