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Body thickness dependence of impact ionization in a multiple-gate FinFET Han, Jin-Woo; Lee, Jiye; Park, Donggun; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.28, no.7, pp.625 - 627, 2007-07 |
Fin-Width Dependence of BJT-Based 1T-DRAM Implemented on FinFET Moon, Dong-Il; Choi, Sung-Jin; Han, Jin-Woo; Kim, Sung-Ho; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.31, no.9, pp.909 - 911, 2010-09 |
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