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Investigation on the Hump Effect Utilizing the Capacitance Voltage Characteristics of a-InGaZnO Thin Film Transistor Kim, Dong-Uk; Park, Sang-Hee Ko; Choe, Heehwan; Jeon, Jae-Hong, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.17, no.11, pp.8545 - 8548, 2017-11 |
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