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Measurement of the differential Pockels and Kerr coefficients of thin films by a two-beam polarization interferometer with a reflection configuration Spirin, VV; Mendieta, FJ; No, Kwangsoo, FERROELECTRICS, v.271, pp.1911 - 1916, 2002 |
Measurement of the quadratic electrooptic coefficient of lead zirconate titanate thin film by a two-beam polarization interferometer Spirin, VV; Lee, CH; No, Kwangsoo, OPTICS COMMUNICATIONS, v.158, no.1-6, pp.239 - 249, 1998-12 |
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