Showing results 1 to 1 of 1
Spectroscopic ellipsometry analysis for investigation of the modification of thin film p-a-Si1-xCx : H after ultraviolet treatment in an Argon ambient Myong, SY; Kim, SS; Lim, Koeng Su, THIN SOLID FILMS, v.455, pp.482 - 485, 2004-05 |
Discover