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Jeon, Sanghun (전상훈)
부교수, School of Electrical Engineering(전기및전자공학부)
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    NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
    Broad spectral responsivity in highly photoconductive InZnO/MoS2 heterojunction phototransistor with ultrathin transparent metal electrode

    Das, Dipjyoti; Park, Junghak; Ahn, Minho; et al, NANOTECHNOLOGY, v.31, no.3, 2020-01

    Improved optical performance of multi-layer MoS2 phototransistor with see-through metal electrode

    Park, Junghak; Das, Dipjyoti; Ahn, Minho; et al, NANO CONVERGENCE, v.6, no.1, 2019-12

    Transparent and Flexible Mayan-Pyramid-based Pressure Sensor using Facile-Transferred Indium tin Oxide for Bimodal Sensor Applications

    Jung, Minhyun; Vishwanath, Sujaya Kumar; Kim, Jihoon; et al, SCIENTIFIC REPORTS, v.9, 2019-10

    Comprehensive study of high pressure annealing on the ferroelectric properties of Hf0.5Zr0.5O2 thin films

    Oh, Changyong; Tewari, Amit; Kim, Kyungkwan; et al, NANOTECHNOLOGY, v.30, no.50, 2019-10

    Flexible Multimodal Sensors for Electronic Skin: Principle, Materials, Device, Array Architecture, and Data Acquisition Method

    Jeon, Sanghunresearcher; Lim, Soo-Chul; Tran Quang Trung; et al, PROCEEDINGS OF THE IEEE, v.107, no.10, pp.2065 - 2083, 2019-10

    Influence of High-Pressure Annealing on Memory Properties of Hf0.5Zr0.5O2 Based 1T-FeRAM

    Yoon, Jae Seok; Tewari, Amit; Shin, Changhwan; et al, IEEE ELECTRON DEVICE LETTERS, v.40, no.7, pp.1076 - 1079, 2019-07

    Robust and scalable three-dimensional spacer textile pressure sensor for human motion detection

    Kim, Kyungkwan; Jung, Minhyun; Jeon, Sanghunresearcher; et al, SMART MATERIALS AND STRUCTURES, v.28, no.6, 2019-06

    Amorphous FeZr metal for multi-functional sensor in electronic skin

    Jung, Minhyun; Lee, Eunha; Kim, Dongseuk; et al, NPG Flexible Electronics, v.3, 2019-04

    Scalable and facile synthesis of stretchable thermoelectric fabric for wearable self-powered temperature sensors

    Jung, Minhyun; Jeon, Sanghunresearcher; Bae, Jihyun, RSC ADVANCES, v.8, no.70, pp.39992 - 39999, 2018-12

    First-order reversal curve diagrams for characterizing ferroelectricity of Hf0.5Zr0.5O2 films grown at different rates

    Goh, Youngin; Jeon, Sanghunresearcher, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.36, no.5, 2018-09

    Effect of dysprosium and lutetium metal buffer layers on the resistive switching characteristics of Cu-Sn alloy-based conductive-bridge random access memory

    Vishwanath, Sujaya Kumar; Woo, Hyunsuk; Jeon, Sanghunresearcher, NANOTECHNOLOGY, v.29, no.38, 2018-09

    Discharge Current Analysis Estimating the Defect Sites in Amorphous Hafnia Thin-Film Transistor

    Goh, Youngin; Jeon, Sanghunresearcher, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.8, pp.3264 - 3268, 2018-08

    The effect of the bottom electrode on ferroelectric tunnel junctions based on CMOS-compatible HfO2

    Goh, Youngin; Jeon, Sanghunresearcher, NANOTECHNOLOGY, v.29, no.33, 2018-08

    Enhanced tunneling electroresistance effects in HfZrO-based ferroelectric tunnel junctions by high-pressure nitrogen annealing

    Goh, Youngin; Jeon, Sanghunresearcher, APPLIED PHYSICS LETTERS, v.113, no.5, 2018-07

    Resistive switching characteristics of a modified active electrode and Ti buffer layer in Cu-Se-based atomic switch

    Woo, Hyunsuk; Vishwanath, Sujaya Kumar; Jeon, Sanghunresearcher, JOURNAL OF ALLOYS AND COMPOUNDS, v.753, pp.551 - 557, 2018-07

    Non-volatile resistive switching in CuBi-based conductive bridge random access memory device

    Vishwanath, Sujaya Kumar; Woo, Hyunsuk; Jeon, Sanghunresearcher, APPLIED PHYSICS LETTERS, v.112, no.25, 2018-06

    Enhancement of resistive switching properties in Al2O3 bilayer-based atomic switches: multilevel resistive switching

    Vishwanath, Sujaya Kumar; Woo, Hyunsuk; Jeon, Sanghunresearcher, NANOTECHNOLOGY, v.29, no.23, 2018-06

    Pulse Switching Study on the HfZrO Ferroelectric Films With High Pressure Annealing

    Kim, Taeho; Jeon, Sanghunresearcher, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.5, pp.1771 - 1773, 2018-05

    Quantitative analysis of charge trapping and classification of sub-gap states in MoS2 TFT by pulse I-V method

    Park, Junghak; Hur, Ji-Hyun; Jeon, Sanghunresearcher, NANOTECHNOLOGY, v.29, no.17, 2018-04

    Effects of high pressure nitrogen annealing on ferroelectric Hf0.5Zr0.5O2 films

    Kim, Taeho; Park, Jinsung; Cheong, Byoung-Ho; et al, APPLIED PHYSICS LETTERS, v.112, no.9, 2018-03

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