Researcher Page

사진
Kim, Heeyoung (김희영)
부교수, (산업및시스템공학과)
Research Area
Applied Statistics, Machine Learning , Data Science
Co-researchers
    Similar researchers

    Keyword Cloud

    Reload 더보기
    NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
    1
    Tutorial on Matching-based Causal Analysis of Human Behaviors Using Smartphone Sensor Data

    Jung, Gyuwon; Park, Sangjun; Ma, Eun-Yeol; et al, ACM COMPUTING SURVEYS, v.56, no.9, 2024-09

    2
    Deep Latent Factor Model for Spatio-Temporal Forecasting

    Koo, Wonmo; Ma, Eun-Yeol; Kim, Heeyoung, TECHNOMETRICS, v.66, no.3, pp.470 - 482, 2024-07

    3
    Simultaneous Deep Clustering and Feature Selection via K-Concrete Autoencoder

    Doo, Woojin; Kim, Heeyoung, IEEE TRANSACTIONS ON KNOWLEDGE AND DATA ENGINEERING, v.36, no.6, pp.2629 - 2642, 2024-06

    4
    Spatially-correlated time series clustering using location-dependent Dirichlet process mixture model

    Jung, Junsub; Kim, Sungil; Kim, Heeyoung, STATISTICAL ANALYSIS AND DATA MINING, v.17, no.1, 2024-02

    5
    Contextual anomaly detection for multivariate time series data

    Kim, Hyojoong; Kim, Heeyoung, QUALITY ENGINEERING, v.35, no.4, pp.686 - 695, 2023-10

    6
    Prediction of Highly Imbalanced Semiconductor Chip-Level Defects in Module Tests Using Multimodal Fusion and Logit Adjustment

    Cho, Hunsung; Koo, Wonmo; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.3, pp.425 - 433, 2023-08

    7
    Semi-Supervised Learning for Simultaneous Location Detection and Classification of Mixed-Type Defect Patterns in Wafer Bin Maps

    Lee, Hyuck; Lee, Jaehyun; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.2, pp.220 - 230, 2023-05

    8
    Deep embedding kernel mixture networks for conditional anomaly detection in high-dimensional data

    Kim, Hyojoong; Kim, Heeyoung, INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, v.61, no.4, pp.1101 - 1113, 2023-03

    9
    Contextual anomaly detection for high-dimensional data using Dirichlet process variational autoencoder

    Kim, Hyojoong; Kim, Heeyoung, IISE TRANSACTIONS, v.55, no.5, pp.433 - 444, 2023-01

    10
    Toward Data-Driven Digital Therapeutics Analytics: Literature Review and Research Directions

    Lee, Uichin; Jung, Gyuwon; Ma, Eun-Yeol; et al, IEEE-CAA JOURNAL OF AUTOMATICA SINICA, v.10, no.1, pp.42 - 66, 2023-01

    11
    Label-Noise Robust Deep Generative Model for Semi-Supervised Learning

    Yoon, Heegeon; Kim, Heeyoung, TECHNOMETRICS, v.65, no.1, pp.83 - 95, 2023-01

    12
    Prediction of highly imbalanced semiconductor chip-level defects using uncertainty-based adaptive margin learning

    Park, Sumin; Kim, Keunseo; Kim, Heeyoung, IISE TRANSACTIONS, v.55, no.2, pp.147 - 155, 2022-11

    13
    Deep Gaussian process models for integrating multifidelity experiments with nonstationary relationships

    Ko, Jongwoo; Kim, Heeyoung, IISE TRANSACTIONS, v.54, no.7, pp.686 - 698, 2022-07

    14
    Toward Robust Battle Experimental Design for Command and Control of Mechanized Infantry Brigade

    Yun, Woo-Seop; Ko, Sunggil; Byun, Muhyun; et al, MILITARY OPERATIONS RESEARCH, v.27, no.1, pp.45 - 72, 2022-05

    15
    Simultaneous band selection and segmentation of hyperspectral images via a mixture of finite maximum margin mixtures

    Doo, Woojin; Kim, Heeyoung, INTERNATIONAL JOURNAL OF REMOTE SENSING, v.43, no.6, pp.2296 - 2314, 2022-03

    16
    Bayesian variable selection in clustering high-dimensional data via a mixture of finite mixtures

    Doo, Woojin; Kim, Heeyoung, JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION, v.91, no.12, pp.2551 - 2568, 2021-08

    17
    Robust estimation of sparse precision matrix using adaptive weighted graphical lasso approach

    Tang, Peng; Jiang, Huijing; Kim, Heeyoung; et al, JOURNAL OF NONPARAMETRIC STATISTICS, v.33, no.2, pp.249 - 272, 2021-04

    18
    Combined unsupervised-supervised machine learning for phenotyping complex diseases with its application to obstructive sleep apnea

    Ma, Eun-Yeol; Kim, Jeong-Whun; Lee, Youngmin; et al, SCIENTIFIC REPORTS, v.11, no.1, 2021-02

    19
    Bayesian nonparametric latent class model for longitudinal data

    Koo, Wonmo; Kim, Heeyoung, STATISTICAL METHODS IN MEDICAL RESEARCH, v.29, no.11, pp.3381 - 3395, 2020-11

    20
    Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps With Mixed-Type Defect Patterns

    Lee, Hyuck; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.653 - 662, 2020-11

    Load more items
    Loading...

    rss_1.0 rss_2.0 atom_1.0