Nondestructive Measurement of Critical Current Distribution of SmBCO Coated Conductor Using Hall Probe

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dc.contributor.authorKim, HSko
dc.contributor.authorOh, SSko
dc.contributor.authorLee, NJko
dc.contributor.authorBaik, SKko
dc.contributor.authorHa, DWko
dc.contributor.authorKo, RKko
dc.contributor.authorHa, HSko
dc.contributor.authorKim, THko
dc.contributor.authorYoum, Do-Junko
dc.contributor.authorMoon, SHko
dc.contributor.authorPark, Cko
dc.date.accessioned2013-03-09T11:41:16Z-
dc.date.available2013-03-09T11:41:16Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2010-06-
dc.identifier.citationIEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, v.20, pp.1537 - 1540-
dc.identifier.issn1051-8223-
dc.identifier.urihttp://hdl.handle.net/10203/96257-
dc.description.abstractThe Hall probe measurement system was used to measure the critical current distribution of superconducting coated conductor. The system consists of reel to reel moving apparatus, 7 array Hall probe, a rotary encoder and permanent magnet. The magnetic field profile across the width of superconducting coated conductor using Bean's critical state model was calculated. The effect of various parameters of the formulas on the magnetic field distribution and the effect of shape and size of artificial defects, which were formed on the surface of SmBa(2)Cu(3)O(7-d)(SmBCO) coated conductor using laser marking system, on the Hall probe magnetic field signal of the Hall probe measurement system was investigated.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectTAPES-
dc.titleNondestructive Measurement of Critical Current Distribution of SmBCO Coated Conductor Using Hall Probe-
dc.typeArticle-
dc.identifier.wosid000283559900340-
dc.identifier.scopusid2-s2.0-77952956734-
dc.type.rimsART-
dc.citation.volume20-
dc.citation.beginningpage1537-
dc.citation.endingpage1540-
dc.citation.publicationnameIEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY-
dc.contributor.localauthorYoum, Do-Jun-
dc.contributor.nonIdAuthorKim, HS-
dc.contributor.nonIdAuthorOh, SS-
dc.contributor.nonIdAuthorLee, NJ-
dc.contributor.nonIdAuthorBaik, SK-
dc.contributor.nonIdAuthorHa, DW-
dc.contributor.nonIdAuthorKo, RK-
dc.contributor.nonIdAuthorHa, HS-
dc.contributor.nonIdAuthorKim, TH-
dc.contributor.nonIdAuthorMoon, SH-
dc.contributor.nonIdAuthorPark, C-
dc.type.journalArticleArticle; Proceedings Paper-
dc.subject.keywordAuthorBean model-
dc.subject.keywordAuthorHall probe-
dc.subject.keywordAuthornon destructive measurement-
dc.subject.keywordAuthorsuperconducting tape-
dc.subject.keywordPlusTAPES-
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