Retardation of boron diffusion in SiGe alloy

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We investigate the effect of Ge on the retardation of B diffusion in SiGe alloys through first-principle calculations, and find that the Ge bonding effect is most significant in the nearest-neighborhood of B. The B dopant diffuses from a self-interstitial-B pair via an interstitialcy mechanism for neutral charge state, while a kick-out mechanism is also possible for 1 + charge state. The migration and activation energies depend on the number and positions of the Ge atoms and are generally enhanced by the presence of Ge, reducing the B diffusivity. (C) 2007 Elsevier B.V. All rights reserved.
Publisher
ELSEVIER SCIENCE BV
Issue Date
2007-12
Language
English
Article Type
Article; Proceedings Paper
Keywords

TRANSIENT ENHANCED DIFFUSION; SILICON; SI1-XGEX

Citation

PHYSICA B-CONDENSED MATTER, v.401, pp.196 - 199

ISSN
0921-4526
URI
http://hdl.handle.net/10203/89414
Appears in Collection
PH-Journal Papers(저널논문)
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